47513banner3.jpg

WELCOME TO The SURFACE TECHNOLOGIES

Innovative metrology and characterization are becoming critical for development of nano/micro circuit technology and clean technology cluster. The progressive introduction of new materials, novel processing and assembly, and innovative devices bring forth formidable metrology and diagnostic challenges in recent years due to rapid consumerization of silicon by the new generation. Advanced characterization has thus become a key enabler in improving nano-scale process technology as well as solar cell / LED manufacturing.

Products
View all

Services

  • Cross section and SEM imaging.
  • Non-destructive imaging and tomography of electronic packages.
  • IC imaging by dry and wet etching.
  • Particle, micro-contamination detection and distribution.
  • Chip bond failure.
  • Inter-meallic and solder-ability issues.

NEWS & EVENTS

No Records Found...!